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                  第三代
                  半導(dǎo)體測(cè)試家族
                  Third generation semiconductor testing family
                   
                  KGD handler



                  Suspended power supply

                  Multiple sites in parallel

                  Multi-channel high precision

                  Supports multiple extensions

                  Model KGD handler
                  Product introduction Fully automatic testing, supporting SiC wafer, Waffle Pack, Tape&Reel loading and unloading.
                  Features ? Multi-station parallel testing, different stations support different temperatures and test items.
                  ? Static, dynamic, avalanche function testing, and the test sequence is adjustable.
                  ? High temperature preheating and chip surface anti-oxidation protection.
                  ? High temperature test, temperature range: room temperature~200°C.
                  ? The power-on pin card is sealed and supports nitrogen filling to protect against high-pressure sparks and nitrogen pressure monitoring.


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