第三代
半導(dǎo)體測(cè)試家族
Third generation semiconductor testing family
分類
KGD handler
Suspended power supply |
Multiple sites in parallel |
Multi-channel high precision |
Supports multiple extensions |
Model | KGD handler |
Product introduction |
Fully automatic testing, supporting SiC wafer, Waffle Pack, Tape&Reel loading and unloading. |
Features |
? Multi-station parallel testing, different stations support different temperatures and test items. ? Static, dynamic, avalanche function testing, and the test sequence is adjustable. ? High temperature preheating and chip surface anti-oxidation protection. ? High temperature test, temperature range: room temperature~200°C. ? The power-on pin card is sealed and supports nitrogen filling to protect against high-pressure sparks and nitrogen pressure monitoring. |
Recommend推薦產(chǎn)品
中國(guó)廣東省佛山市南海國(guó)家高新區(qū)新光源產(chǎn)業(yè)基地光明大道16號(hào) | |
0757 83207313 (銷售) | |
0757 83208786 (銷售) | |
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