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                  第三代
                  半導體測試家族
                  Third generation semiconductor testing family
                  分類
                   
                  Prober

                  Suitable for automatic probe testing of wafers such as 6 and 8″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc. Automatic loading and unloading, Wafer ID reading. Fully automatic CCD visual n



                  Suspended power supply

                  Multiple sites in parallel

                  Multi-channel high precision

                  Supports multiple extensions

                  Model Prober
                  Product introduction Suitable for automatic probe testing of wafers such as 6 and 8″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc. Automatic loading and unloading, Wafer ID reading.
                  Features ? Fully automatic CCD visual needle positioning.
                  ? High-precision positioning platform.
                  ? Support normal high temperature testing.
                  ? Generate Mapping display Bin in real time.
                  ? Universal GPIB, TTL, R-232 interface.


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