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                  第三代
                  半導體測試家族
                  Third generation semiconductor testing family
                   
        
        
                  分類
                  
    
                   
                   
     
    
            
    
                   
                  
        
                    
        
           
             
        
                         
               
        
                
                
                
        
                  
    
                  
      
     
    
    
                   
            
            
                  
                  
                  
                       
                       
                    
                          
                                             
                       
     
                          
                          
                       
                  
           
                 
                  
                 
                  
           
                
                   

                  
    
                  
             
                             
                        
                  
                            
                  
                                
                  
                                    
                  
                                    
                                                        
                                                    
                              
                                 
                
                
                
                
                                        
                                                   
                                    
                  
                                    
                  
                                    
                  
                                    
                  
                                
                  
                            
                  
                            
                  
                                                        
                            
                            
                            
                   
                        
                  
             
                  
             
                  
                    
                  
                             
                  Prober
                  
                             
                  Suitable for automatic probe testing of wafers such as 6 and 8″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc.
Automatic loading and unloading, Wafer ID reading.
Fully automatic CCD visual n
                  
                             
                   


                  

                  

                  
	
		
                  
			
				
                  
					 
				
                  
				
                  
					Suspended power supply
				
                  
			                  		
			
				
                  
					 
				
                  
				
                  
					Multiple sites in parallel
				
                  
			                  		
			
				
                  
					 
				
                  
				
                  
					Multi-channel high precision
				
                  
			                  		
			
				
                  
					 
				
                  
				
                  
					Supports multiple extensions
				
                  
			                  		
		
                  
	                  

                  
                             
                  
                             
                  
                                                          
                  
                    
                  
             
                  
    
                    
    
                  
    

                  
	
		
                  
			
				Model 
			
			
				Prober
			
		
                  
		
                  
			
				Product introduction 
			
			
				Suitable for automatic probe testing of wafers such as 6 and 8″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc.
Automatic loading and unloading, Wafer ID reading. 
                  
			                  		
		
                  
		
                  
			
				Features 
			
			
				? Fully automatic CCD visual needle positioning. 
                  
         ? High-precision positioning platform. 
                  
         ? Support normal high temperature testing. 
                  
         ? Generate Mapping display Bin in real time. 
                  
         ? Universal GPIB, TTL, R-232 interface. 
                  
			                  		
		
                  
	                  

                  

                  
                           
                  

   
    
               
  
                
                
    
                  
    
    
    
    
    
    
                  
        
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