<del id="jzfw3"></del>
          <b id="jzfw3"></b>
          1. <th id="jzfw3"><progress id="jzfw3"></progress></th>

              1. <strong id="jzfw3"><dl id="jzfw3"></dl></strong>
                  第三代
                  半導(dǎo)體測(cè)試家族
                  Third generation semiconductor testing family
                  首頁(yè) 產(chǎn)品中心 Test System Power Device Testing System
                  分類
                   
                  KGD (Know Good Die) testing solution

                  Supports high temperature and normal temperature testing: DC+SW+UIL+DC&RG; Support testing pin card protection scheme; Provide a complete set of testing + sorting solutions;



                  Pin card 

                  protection

                    

                  Two-DUT test in parallel

                  High temperature and 

                  normal temperature

                  Data merge

                  Model KGD testing solutions
                  Product Advantages ? Low spurious solutions;
                  ? Exclusive pin card protection patented technology;
                  ? Overload and undervoltage protection;
                  ? Test two wafers at a time;
                  ? Supports high temperature heating




                  Recommend推薦產(chǎn)品
                  无码少妇一区二区性色Av,国产福利在线观看无码卡一,思思在线精品视频综合首页,99re8精品视频在线播放 毛片一级av中文字av毛片 无码日漫一区二区在线观看

                          
                          
                          <del id="jzfw3"></del>
                          <b id="jzfw3"></b>
                          1. <th id="jzfw3"><progress id="jzfw3"></progress></th>

                              1. <strong id="jzfw3"><dl id="jzfw3"></dl></strong>