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                  第三代
                  半導(dǎo)體測(cè)試家族
                  Third generation semiconductor testing family
                   
        
        
                  首頁(yè) 產(chǎn)品中心 Test System Power Device Testing System
                  分類
                  
    
                   
                   
     
    
            
    
                   
                  
        
                    
        
           
             
        
                         
               
        
                
                
                
        
                  
    
                  
      
     
    
    
                   
            
            
                  
                  
                  
                       
                       
                    
                          
                                             
                       
     
                          
                          
                       
                  
           
                 
                  
                 
                  
           
                
                   

                  
    
                  
             
                             
                        
                  
                            
                  
                                
                  
                                    
                  
                                    
                                                        
                                                    
                              
                                 
                
                
                
                
                                        
                                                   
                                    
                  
                                    
                  
                                    
                  
                                    
                  
                                
                  
                            
                  
                            
                  
                                                        
                            
                            
                            
                   
                        
                  
             
                  
             
                  
                    
                  
                             
                  KGD (Know Good Die) testing solution
                  
                             
                  Supports high temperature and normal temperature testing: DC+SW+UIL+DC&RG;
Support testing pin card protection scheme;
Provide a complete set of testing + sorting solutions;
                  
                             
                   


                  

                  

                  
	
		
                  
			
				
                  
					  
				
                  
				
                  
					Pin card 
				
                  
				
                  
					protection
                  
                        
				
                  
			                  		
			
				
                  
					    
				
                  
				
                  
					Two-DUT test in parallel
                  
                        
				
                  
			                  		
			
				
                  
					  
				
                  
				
                  
					High temperature and  
				
                  
				
                  
					normal temperature 
				
                  
			                  		
			
				
                  
					  
				
                  
				
                  
					Data merge 
				
                  
			                  		
		
                  
	                  

                  
                             
                  
                             
                  
                                                          
                  
                    
                  
             
                  
    
                    
    
                  
    

                  
	
		
                  
			
				Model 
			
			
				KGD testing solutions
			
		
                  
		
                  
			
				Product Advantages 
			
			
				? Low spurious solutions;
                  
                                                 ? Exclusive pin card protection patented technology;
                  
                                                 ? Overload and undervoltage protection;
                  
                                                 ? Test two wafers at a time;
                  
                                                 ? Supports high temperature heating
                  
			                  		
		
                  
		
                  
			
				
                  
			                  		
			
				
                  
			                  		
		
                  
	                  

                  

                  
                                                                            
                  

   
    
               
  
                
                
    
                  
    
    
    
    
    
    
                  
        
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