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                  第三代
                  半導(dǎo)體測(cè)試家族
                  Third generation semiconductor testing family
                   
        
        
                  首頁(yè) 產(chǎn)品中心 Test System Power Device Testing System
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                  QT-DRM101000 GaN Dynamic RDON
                  
                             
                  Suitable for dynamic RDON parameter testing of gallium nitride. Can be combined with QT-4100, QT-8000 to form a test solution
                  
                             
                   


                  

                  

                  
	
		
                  
			
				
                  
					  
				
                  
				
                  
					Hard handover <1us
                  
                       
				
                  
			                  		
			
				
                  
					  
				
                  
				
                  
					Supports resistive/ 
				
                  
				
                  
					inductive loads 
				
                  
			                  		
			
				
                  
					  
				
                  
				
                  
					Support hard/ 
				
                  
				
                  
					soft handover
                  
                       
				
                  
			                  		
			
				
                  
					  
				
                  
				
                  
					Multiple-pulse output
                  
                       
				
                  
			                  		
		
                  
	                  

                  
                             
                  
                             
                  
                                                          
                  
                    
                  
             
                  
    
                    
    
                  
    

                  
	
		
                  
			
				Type 
			
			
				QT-DRM101000
			
		
                  
		
                  
			
				Advantages 
			
			
				
                  
					QT-DRM101000 is suitable for dynamic RDON parameter testing of gallium nitride. Can be combined with QT-4100, QT-8000 to form a test solution
				
                  
			                  		
		
                  
		
                  
			
				Main Features 
			
			
				
                  
					? Support FT or CP, laboratory, mass production testing
				
                  
				
                  
					? Hard handover and soft handover, hard handover can meet the requirement of<1uS measurement RDON 
				
                  
				
                  
					? Output capacity 10A/1000V
				
                  
				
                  
					
                  
				
                  
			                  		
		
                  
	                  

                  

                  
                               
                  

   
    
               
  
                
                
    
                  
    
    
    
    
    
    
                  
        
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