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                  第三代
                  半導(dǎo)體測試家族
                  Third generation semiconductor testing family
                  首頁 產(chǎn)品中心 Test System Power Device Testing System
                  分類
                   
                  QT-3105 TRR diode reverse recovery test

                  Self-developed LCR digital bridge supports Mosfet RG/CG test and can also be used to test the capacitance of diodes, with a resolution of 1fF



                  Independent programmable power supply

                  Support double DIE

                  Dual channel test

                  Waveform display

                  Type QT-3105TRR
                  Advantages Supports dual-core TRR parameter testing, equipped with VRR voltage probe
                  Main Features ? Output capability IF 100A VR 1KV di/dt>1000A Measurement resolution 0.1ns

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