第三代
半導(dǎo)體測(cè)試家族
Third generation semiconductor testing family
分類(lèi)
QT-3104 QG gate charge test
QT-3104 QG meets the tiny QG value test of SiC devices.
Support double DIE |
Overload and undervoltage protection |
High precision testing |
Support extension |
Model | QT-3104 QG |
Product Advantages | Meets the tiny QG value test of SiC devices |
Key Features | ? Test capability: 200A/150V 150A/1000V |
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