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                  第三代
                  半導(dǎo)體測試家族
                  Third generation semiconductor testing family
                  首頁 產(chǎn)品中心 Test System Power Device Testing System
                  分類
                   
                  QT-3102 thermal resistance tester

                  QT-3102-XX test device type: triode, field effect tube, IGBT, diode



                  Support double DIE

                  1000W thermal resistance

                  Overload and undervoltage protection



                  Type QT-3102
                  Advantages QT-3102-XX test device type: triode, field effect tube, IGBT, diode
                  R26: Can be built into the DC test item of QT-4100 to achieve high-power built-in thermal resistance testing
                  R26:Dual Die testing can be implemented through scanbox
                  Main Features ? The maximum current and maximum voltage depend on the model. The maximum current is 20A and 50A respectively.
                  ? The maximum voltages are 100V and 200V respectively




                  Items Range Step Current Precision
                  Bias Current 0.01 to 20A/50a 0.01a ±1%+2mA
                  Measuring Current 1 to 100mA 1 mA 1 to 39 mA
                  ±1% + 0.2 mA
                  40 to 100 mA ±3%
                  Threshold Voltage Fixed initial value of ± 5V 0.1V ±0.5V
                  Power Consumption Time 300us to 200ms in the offset power range 1 us Crystal
                  Delay Time 10 to 999 us 1 us ±1 us 晶體
                  Upper/Lower Limit 0 to 9999 mV 1 mV /
                  0 to 999.9 mV 0.1mV /
                  VCB/VDS 1 to 100V / 200V 1 V ±0.2% + 0.1V
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