第三代
半導(dǎo)體測試家族
Third generation semiconductor testing family
分類
QT-3102 thermal resistance tester
QT-3102-XX test device type: triode, field effect tube, IGBT, diode
|
Support double DIE |
1000W thermal resistance |
Overload and undervoltage protection |
|
| Type | QT-3102 |
| Advantages |
QT-3102-XX test device type: triode, field effect tube, IGBT, diode R26: Can be built into the DC test item of QT-4100 to achieve high-power built-in thermal resistance testing R26：Dual Die testing can be implemented through scanbox |
| Main Features |
? The maximum current and maximum voltage depend on the model. The maximum current is 20A and 50A respectively. ? The maximum voltages are 100V and 200V respectively |
| Items | Range | Step Current | Precision |
| Bias Current | 0.01 to 20A/50a | 0.01a | ±1%+2mA |
| Measuring Current | 1 to 100mA | 1 mA |
1 to 39 mA ±1% + 0.2 mA 40 to 100 mA ±3% |
| Threshold Voltage | Fixed initial value of ± 5V | 0.1V | ±0.5V |
| Power Consumption Time | 300us to 200ms in the offset power range | 1 us | Crystal |
| Delay Time | 10 to 999 us | 1 us | ±1 us 晶體 |
| Upper/Lower Limit | 0 to 9999 mV | 1 mV | / |
| 0 to 999.9 mV | 0.1mV | / | |
| VCB/VDS | 1 to 100V / 200V | 1 V | ±0.2% + 0.1V |
Recommend推薦產(chǎn)品
|
中國廣東省佛山市南海國家高新區(qū)新光源產(chǎn)業(yè)基地光明大道16號 |
|
0757 83207313 (銷售) |
|
0757 83208786 (銷售) |
|
info@powertechsemi.com |
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