第三代
半導(dǎo)體測(cè)試家族
Third generation semiconductor testing family
分類
QT-3101 UIL avalanche test
QT-3101 UIL avalanche test is suitable for testing avalanche parameters of MOSFETs, IGBTs and diodes
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Support double DIE |
Fast charging |
Save failure waveform |
Clamp voltage function |
| Type | QT-3101 UIL |
| Advantages |
? Support VDD ON(E=1/2L*I*I*BVDSS/(BVDSS-VDD)) or VDD OFF(E=1/2*L*I*I) test ? Can share a computer with QT-4100B to achieve unified management of test programs and data ? Single pulse, multi-pulse or dual MOSFET testing can be set ? Real-time measurement monitors, output current, IDMAX, and Energy readouts ? The internal resistance of the inductor is low, the ID charging is fast, and the test time is shorter ? Built-in oscilloscope |
| Main Features |
? Output measurement capability: Maximum measurement BVdss: ±3000V Maximum output ID: ±150V, ±200A ? Editable VG MAX: ±30V pulse width adjustment (resolution: 1us) ? Programmable inductor box load 10μH-159.9mH step 10μH ? 24 programmable sorting machine interface signals |
Recommend推薦產(chǎn)品
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中國廣東省佛山市南海國家高新區(qū)新光源產(chǎn)業(yè)基地光明大道16號(hào) |
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0757 83207313 (銷售) |
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0757 83208786 (銷售) |
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info@powertechsemi.com |
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