第三代
半導(dǎo)體測試家族
Third generation semiconductor testing family
分類
QT-6000 Discrete Device High-Speed Test System
QT-6000 discrete device high-speed testing machine is suitable for testing small and medium-power diodes, transistors, field effect transistors and other products and wafers. It can expand built-in capacitance testing (DC+CAP), EAS, VC, pA modules, as well as external LCR (ultra high precision capacitance testing), Scanbox, etc. The machine can be used for FT mass production testing or laboratory testing.
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Suspended power supply |
Four quadrant circuit |
High speed test |
Supports multiple extensions |
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Type |
QT-6000 |
| Advantages |
? QT-6000 discrete device high-speed testing machine has the performance advantages of high testing accuracy, fast testing speed, good stability, high reliability and strong anti-interference ability. ? Adopting four-quadrant circuit, the device under test can be protected very well. ? Adopting suspended power supply and fully symmetrical structure. ? High-speed testing meets the requirements of handler above UPH56K. |
| Main Features |
? High speed test, UPH>40K ? One-to-two can achieve 100% FT+QA parallel testing ? Advanced capacitor high-speed test solution to achieve CAP+DC same-station testing ? Built-in UIS test solution to achieve DC+UIS same-station testing ? LCR precision capacitance test, the minimum test capacitance value is 100fF ? Voltage/current (optional): 1200V/600V, 30A/ 10A/3A. |
Testing standards檢測標(biāo)準(zhǔn)
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