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                  新聞動(dòng)態(tài)
                  News and information
                  首頁 新聞動(dòng)態(tài) "Core Power, Innovation to the World" SEMICON China 2024
                  "Core Power, Innovation to the World" SEMICON China 2024
                  032024.22
                  writer:Powertech  pubdate:2024-03-22 00:00:00   visits:1446
                         On March 22, 2024, the spring scenery was bright and the spring breeze turned green on the south bank of the river. The SEMICON China 2024 exhibition comes to an end today. As the world's most influential annual event in the semiconductor industry, during the three-day exhibition, we set out again to show new and old customers the company's latest research and development QT-8409PIM power module test system and QT-8200PLUS digital-analog hybrid test system , the QT-3108SWH IGBT/SiC dynamic test system, and also launched the gravity-type high-temperature test sorting system and the QH-GT1304H and probe + tester one-stop solutions, bringing a new worry-free experience to high-temperature, high-voltage, and large-current testing. experience. The company will keep pace with the times, accelerate research and development to improve product performance and promote innovative technologies to improve customer productivity.

                  Product Highlights:
                         The QT-8409PIM power module test system has attracted the attention of many people in the industry with its high performance, high-speed protection (less than 2uS), low stray inductance (25nH), and high efficiency. The system can accurately and quickly test various performance parameters of power modules, providing a reliable testing method for semiconductor companies.
                         The QT-8200PLUS multi-SITE test digital-analog mixed-signal IC test system meets customers' needs for complex IC testing with its excellent test performance. This system can not only perform efficient digital signal testing, but also accurately measure analog signals, providing strong support for the R&D and production of semiconductor companies.

                         QT-3108SWH IGBT/SiC, the dynamic test system uses the Docking connection method on the high-temperature gravity Handler to achieve dual-track parallel testing to improve test efficiency, surpassing similar equipment, and is a perfect solution. It demonstrates the technical strength of Linkage Technology in automotive and industrial fields such as new energy vehicles and power electronics. The system can dynamically test power semiconductor devices such as IGBT and SiC, ensuring the reliability of the drive system and power electronic equipment of new energy vehicles.
                         In addition, Linkage Technology also exhibited the gravity-type high-temperature testing and sorting system QH-GT1304H and the probe+tester one-stop solution. These products not only meet customers' needs for high-temperature, high-voltage, and high-current testing, but also provide customers with a more convenient and efficient testing experience.


                         At the exhibition, we conducted full technical and product exchanges with new and old customers, jointly discussed the latest technology and industry development trends in the field of semiconductor testing, and introduced in detail the various performance and application scenarios of the products. The company always adheres to the core values of "customer-centered, people-oriented, efficient collaboration, openness and enterprising" to provide customers with efficient and fast semiconductor testing solutions and make due contributions to the sustainable development and progress of the semiconductor industry.


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